Layer Metrics Inc. is a pioneering company based in Rochester, NY, specializing in opto-photonic sensing and metrology. Their groundbreaking technology offers real-time process monitoring, revolutionizing quality assurance and enabling businesses to reach new heights.
With a focus on every layer, data point, and moment, Layer Metrics Inc. has developed the first-ever built-in, multiplexed metrology and sensing system. This innovative solution ensures enhanced quality, efficiency, and yield, propelling businesses to the next level of success.
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